Daniel Lachance, Mike Meyers, Scott Jernigan

ITF+ CompTIA IT Fundamentals All-in-One Exam Guide, Second Edition (Exam FC0-U61)

kartoniert , 496 Seiten
ISBN 1260441873
EAN 9781260441871
Veröffentlicht Februar 2019
Verlag/Hersteller McGraw-Hill Education
49,00 inkl. MwSt.
Lieferbarkeit unbestimmt (Versand mit Deutscher Post/DHL)
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Beschreibung

This fully updated study guide delivers 100% coverage of every topic on the 2018 CompTIA IT Fundamentals+ exam
Take the CompTIA IT Fundamentals+ exam with complete confidence using this effective self-study system. Written by three CompTIA certification and training experts, this authoritative guide explains foundational computer technologies in full detail. You'll find learning objectives at the beginning of each chapter, exam tips, practice exam questions, and in-depth explanations throughout. Designed to help you pass the exam with ease, this definitive volume also serves as an essential on-the-job reference.
Covers all exam topics, including:
. Computer basics. System hardware. I/O ports and peripherals. Data storage and sharing. PC setup and configuration. Understanding operating systems. Working with applications and files. Setting up and configuring a mobile device. Connecting to networks and the Internet. Handling local and online security threats. Computer maintenance and management. Troubleshooting and problem solving. Understanding databases. Software development and implementation
Online content includes:
. 130 practice exam questions in a customizable test engine. Link to over an hour of free video training from Mike Meyers

Portrait

Michael Meyers, MCP, CompTIA A+, CompTIA Network+, CompTIA Security+ (Houston, TX), is one of the industry's leading authorities on CompTIA certification. He is the president and founder and Total Seminars, LLC, a major provider of PC and network repair seminars for thousands of organizations including IBM, Lucent Technologies, GE, the FBI, the FAA and the United Nations. Mike is the best-selling author of the A+ Certification All-in-One Exam Guide.