Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. - Updated with contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Provides an invaluable reference and guide for physicists, engineers and mathematicians

The beginnings and development of the scanning transmission electron microscope (STEM)Albert V. CreweSTEM in the life sciencesAndreas EngelThe AEI and Siemens STEM instrumentsPeter HawkesSTEM in JapanHiromi InadaEarly work on the STEMMichael S. IsaacsonThe Toulouse high-voltage STEM projectBernard JouffreyAberration-corrected STEMOndrej KrivanekSTEM in CambridgeK.C.A. SmithA review of the cold field electron cathodeLyn Swanson and Greg SchwindSTEM in Oxford and at Vacuum GeneratorsSebastian von HarrachThe Vacuum Generators STEMIan Wardell and Peter BoveyHistorical background of the STEM at Brookhaven National LaboratoryJoseph Wall