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Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter- Informs and updates on the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
1. Intensity interferometry experiment: photon bunching in cathodoluminescenceSophie Meuret2. Applications of photon bunching in cathodoluminescenceSophie Meuret3. A quantum propagator for electrons in a round magnetic lensStefan Löffler, Ann-Lenaig Hamon, Denis Aubry, Peter Schattschneider4. Progress in determining of compound composition by BSE imaging in a SEM and the relevant detector disadvantagesV.G. Dyukova, S.A. Nepijko5. A new paradigm for FDM: cylindrically symmetric electrostaticsDavid Edwards Jr6. Solutions of the Laplace equation in cylindrical coordinates, driven to 2D harmonic potentialsIgor F. Spivak-Lavrov, Telektes Zh. Shugaeva, Samat U. Sharipov7. Characteristics of triode electron gunsR. Lauer
