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Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
1. Intensity interferometry experiment: photon bunching in cathodoluminescence Sophie Meuret 2. Applications of photon bunching in cathodoluminescence Sophie Meuret 3. A quantum propagator for electrons in a round magnetic lens Stefan Löffler, Ann-Lenaig Hamon, Denis Aubry, Peter Schattschneider 4. Progress in determining of compound composition by BSE imaging in a SEM and the relevant detector disadvantages V.G. Dyukova, S.A. Nepijko 5. A new paradigm for FDM: cylindrically symmetric electrostatics David Edwards Jr 6. Solutions of the Laplace equation in cylindrical coordinates, driven to 2D harmonic potentials Igor F. Spivak-Lavrov, Telektes Zh. Shugaeva, Samat U. Sharipov 7. Characteristics of triode electron guns R. Lauer
