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Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter- Informs and updates on the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Part I. Papers from the Tenth International Conference on Charged Particle Optics1. Planar multi-reflecting time-of-flight mass-spectrometer of a simple designSeitkerim B. Bimurzaev2. Generalization of paraxial trajectory method for the analysis of non-paraxial raysShin Fujita3. Test and characterization of a new post-column imaging energy filterFrank Kahl, Volker Gerheim, Martin Linck, Heiko Müller, Richard Schillinger, Stephan Uhlemann4. Electron optics for a multi-pass transmission electron microscopeMarian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich5. A simulation program for electron mirrors using Boundary Element MethodEric Munro, Haoning Liu, Catherine Rouse, John Rouse6. An algorithm for simulating the geometric optics of charged particle instrumentsKhashayar ShadmanPart II. The Nano-aperture Ion Source7. Introduction to focused ion beams, ion sources, and the nano-aperture ion sourceLeon van Kouwen8. Nano-fluidic flow in the nano-aperture ion sourceLeon van Kouwen9. Optics of ion emission from the nano-aperture ion sourceLeon van Kouwen10. A model for ion-neutral scattering in the nano-aperture sourceLeon van Kouwen11. Ion emission simulations of the nano-aperture ion sourceLeon van Kouwen12. Processes in the ionization volume of the nano-aperture ion sourceLeon van Kouwen
