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Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter- Informs and updates on the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Part 1: Quantum degeneracy1. Partially coherent quantum degenerate electron matter wavesSam Keramati, Eric Jones, Jeremy Armstrong, Herman BatelaanPart 2: The contribution of atom probe tomography to the correlation of the optical and structural properties of semiconductor nanostructures2. Laser-assisted atom probe tomographyLorenzo Rigutti3. Inaccuracies in atom probe measurements of semiconductor compositionLorenzo Rigutti4. Atom probe-based correlative microscopyLorenzo Rigutti5. In-situ optical spectroscopy within an atom probeLorenzo RiguttiPart 3: CPO Proceedings Papers6. Derivation, Cross-Validation, and Comparison of Analytic Formulas for Electrostatic Deflector AberrationsEremey Valetov, Martin Berz7. Analysis and Fringe Field Scaling of a Legacy Set of Electrostatic Deflector Aberration FormulasEremey ValetovPart 4: Advances in Optical Electron Microscopy8. Scanning Optical MicroscopyC. J. R. Sheppard
