Principles and Techniques of Electromagnetic Compatibility

This book provides a sound grasp of the fundamental concepts, applications, and practice of EMC. Developments in recent years have resulted in further increases in electrical component density, wider penetration of wireless technologies, and a significant increase in complexity of electrical and electronic equipment. New materials, which can be customized to meet EMC needs, have been introduced. Considerable progress has been made in developing numerical tools for complete system EMC simulation. EMC is now a central consideration in all industrial sectors. Maintaining the holistic approach of the previous edition of Principles and Techniques of Electromagnetic Compatibility, the Third Edition updates coverage of EMC to reflects recent important developments. What is new in the Third Edition? - A comprehensive treatment of new materials (meta- and nano-) and their impact on EMC - Numerical modelling of complex systems and complexity reduction methods - Impact of wireless technologies and the Internet of Things (IoT) on EMC - Testing in reverberation chambers, and in the time-domain - A comprehensive treatment of the scope and development of stochastic models for EMC - EMC issues encountered in automotive, railway, aerospace, and marine applications - Impact of EMC and Intentional EMI (IEMI) on infrastructure, and risk assessment In addition to updating material, new references, examples, and appendices were added to offer further support to readers interested in exploring further. As in previous editions, the emphasis is on building a sound theoretical framework, and demonstrating how it can be turned to practical use in challenging applications. The expectation is that this approach will serve EMC engineers through the inevitable future technological shifts and developments.

Christos Christopoulos received the Diploma in Electrical and Mechanical Engineering from the National Technical University of Athens in 1969 and the MSc and DPhil from the University of Sussex in 1979 and 1974 respectively. In 1974 he joined the Arc Research Project of the University of Liverpool and spent two years working on vacuum arcs and breakdown while on attachments at the UKAEA Culham Laboratory. In 1976 he joined the University of Durham as a Senior Demonstrator in Electrical Engineering Science. In October 1978 he joined the Department of Electrical and Electronic Engineering, University of Nottingham, was promoted to Professor of Electrical Engineering in 1990 and became the Director of the George Green Institute for Electromagnetics Research (GGIEMR) in 2001. He is now Emeritus Professor in Electrical Engineering.

Part I. Underlying Concepts and Techniques. 1. Introduction to Electromagnetic Compatibility. 2. Electromagnetic Fields. 3. Electrical Circuit Components. 4. Electrical Signals and Circuits. Part II. General EMC Concepts and Techniques. 5. Sources of Electromagnetic Interference. 6. Penetration through Shields and Apertures. 7. Propagation and Crosstalk. 8. Simulation of the Electromagnetic Coupling between Systems. 9. Effects of Electromagnetic Interference on Devices and Systems. Part III. 10. Interference Control Techniques. 10. Shielding and Grounding. 11. Filtering and Nonlinear Protective Devices. 12. General EMC Design Principles. Part IV. EMC Standards and Testing. 13. EMC Standards.14. EMC Measurements and Testing. Part V. EMC in Systems Design. 15. EMC and Signal Integrity (SI). 16. EMC and Wireless Technologies. 17. EMC and Broadband Technologies. 18. EMC and Safety. 19. Statistical EMC. 20. EMC in Different Industrial Sectors. 21. EMC Outlook. Appendix A: Useful Vector Formulae. Appendix B: Circuit Parameters of Some Conductor Configurations. Appendix C: The sinx/x Function. Appendix D: Spectra of Trapezoidal Waveforms. Appendix E: Calculation of the Electric Field Received by a Short Electric Dipole. Appendix F: Calculation of the Parameters of a Series RLC Circuit. Appendix G: Computation of Discrete Time-Domain Responses of Lumped Circuits. Appendix H: The Normal (Gaussian) Distribution.