Und dann auf "Zum Home-Bildschirm [+]".
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genialokal zum Startbildschirm hinzufügen
Installieren Sie die genialokal App auf Ihrem Startbildschirm für einen schnellen Zugriff und eine komfortable Nutzung.
Installieren Sie die genialokal App auf Ihrem Startbildschirm für einen schnellen Zugriff und eine komfortable Nutzung.
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter- Informs and updates on the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
1. First principlesHenk J.A.M. Heijmans2. Complete latticesHenk J.A.M. Heijmans3. Operators on complete latticesHenk J.A.M. Heijmans4. Operators which are translation invariantHenk J.A.M. Heijmans5. Adjunctions, dilations, and erosionsHenk J.A.M. Heijmans6. Openings and closingsHenk J.A.M. Heijmans7. Hit-or-miss topology and semi-continuityHenk J.A.M. Heijmans8. DiscretizationHenk J.A.M. Heijmans9. Convexity, distance, and connectivityHenk J.A.M. Heijmans10. Lattice representations of functionsHenk J.A.M. Heijmans11. Morphology for grey-scale imagesHenk J.A.M. Heijmans12. Morphological filtersHenk J.A.M. Heijmans13. Filtering and iterationHenk J.A.M. Heijmans
