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Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies, Volume 222 in the Advances in Imaging and Electron Physics serial, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Updated release includes the latest information on the Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies
PrefaceMartin Hÿtch and Peter W. Hawkes1. A brief introduction to nano-optics with fast electronsHugo Lourenço-Martins2. A unified description of inelastic scattering of relativistic electron beams and its application to holographyHugo Lourenço-Martins3. Development of phase-shaped electron energy-loss spectroscopy for nano-opticsHugo Lourenço-Martins4. Exploring nano-optical excitations coupling with fast electrons techniquesHugo Lourenço-Martins
