Modern Metallography

Modern Metallography focuses on the defects in the properties of metals, such as precipitates, cracks, grain boundaries, dislocations, stacking faults, and impurity atoms. The publication first offers information on reflected light microscopy and high temperature microscopy. Discussions focus on specimen preparation, defects of lenses, methods of increasing the resolving power of an objective, long working distance objectives, and typical hot-stage experiments. The text then elaborates on surface topography and polarizing microscope, including oblique illumination, interferometry, examination of anisotropic surfaces, and other uses of polarized light microscopy. The text takes a look at X-ray metallography and specialized X-ray diffraction techniques. Topics include Laue method and orientation, structure factor, powder method and the accurate measurement of lattice parameters, Bragg law, sheet textures, and preferred orientation. The publication further elaborates on electron microscopy and metallography at the atomic level. The manuscript is a valuable reference for students and readers interested in modern metallography.

After gaining his PhD in 1953, Professor Smallman spent five years at the Atomic Energy ResearchEstablishment at Harwell before returning to the University of Birmingham, where he became Professorof Physical Metallurgy in 1964 and Feeney Professor and Head of the Department of PhysicalMetallurgy and Science of Materials in 1969. He subsequently became Head of the amalgamatedDepartment of Metallurgy and Materials (1981), Dean of the Faculty of Science and Engineering, andthe first Dean of the newly created Engineering Faculty in 1985. For five years he wasVice-Principalof the University (1987-92).He has held visiting professorship appointments at the University of Stanford, Berkeley, Pennsylvania(USA), New SouthWales (Australia), Hong Kong and Cape Town, and has received HonoraryDoctorates from the University of Novi Sad (Yugoslavia), University ofWales and Cranfield University.His research work has been recognized by the award of the Sir George Beilby Gold Medal of theRoyal Institute of Chemistry and Institute of Metals (1969), the Rosenhain Medal of the Institute ofMetals for contributions to Physical Metallurgy (1972), the Platinum Medal, the premier medal ofthe Institute of Materials (1989), and the Acta Materialia Gold Medal (2004).Hewas elected a Fellowof the Royal Society (1986), a Fellowof the RoyalAcademy of Engineering(1990), a Foreign Associate of the United States National Academy of Engineering (2005), andappointed a Commander of the British Empire (CBE) in 1992. A former Council Member of theScience and Engineering Research Council, he has been Vice-President of the Institute of Materialsand President of the Federated European Materials Societies. Since retirement he has been academicconsultant for a number of institutions both in the UK and overseas.

PrefaceI. Reflected Light Microscopy Introduction Specimen Preparation The Reflected Light Microscope Defects of Lenses Methods of Increasing the Resolving Power of an Objective Examples of the Contrast Observed with Reflected Light Suggestions for Further ReadingII. High Temperature Microscopy Introduction Long Working Distance Objectives Typical Hot-Stage Experiments Suggestions for Further ReadingIII. Surface Topography The Importance of Surface Topography Observations Oblique Illumination Opaque Stop and Phase Contrast Interferometry Examples of Surface Topography Suggestions for Further ReadingIV. The Polarizing Microscope Polarized Light Examination of Anisotropic Surfaces Other Uses of Polarized Light Microscopy Suggestions for Further ReadingV. X-Ray Metallography Introduction White and Characteristic Radiation The Laue Conditions The Bragg Law The Structure Factor The Laue Method and Orientation Determination Powder Method and the Accurate Measurement of Lattice Parameters Appendix to Chapter V The Reciprocal Lattice and the Reflection Sphere Vector Notation Diffraction Suggestions for Further ReadingVI. Specialized X-Ray Diffraction Techniques Introduction Preferred Orientation Wire Textures Sheet Textures Small-Angle X-Ray Scattering Micro-Probe Analyzer The Observation of Dislocations by X-Ray Diffraction Contrast Suggestions for Further ReadingVII. Electron Microscopy-I. Electron Microscope Electron Wavelength The Electron Microscope The Electron Gun and Condenser Lens System Specimen Assembly Lens Defects Control of Focusing and Magnification Bright- and Dark-Field Images Selected Area Diffraction Resolution Recording the Image Microscope Attachments Preparation of Specimens Replica Techniques Thin Metal Foil Techniques Suggestions for Further ReadingVIII. Electron Microscopy-II. Contrast Theory Introduction Diffraction of Electrons by Perfect Crystals Electron Diffraction by an Imperfect Crystal Suggestions for Further ReadingIX. Electron Microscopy-III. Interpretation Introduction Analysis of Selected Area Diffraction Patterns Interpretation of Additional Features on S.A.D. Patterns Indexing Crystallographic Features on Micrographs Contrast from Dislocations and the g. b Analysis Stacking Fault Contrast and the Displacement Vector Measurement of the Stacking Fault Energy Nature of Prismatic Dislocation Loops Dislocation Densities Precipitation Phenomena Heating-Stage Experiments Cooling-Stage Experiments Suggestions for Further ReadingX. Metallography at the Atomic Level Field-Ion Microscope Applications Neutron Diffraction Suggestions for Further ReadingIndex