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Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
1. IntroductionSandra Van Aert2. Statistical parameter estimation theorySandra Van Aert3. Efficient fitting algorithm Sandra Van Aert4. Statistics-based atom counting Sandra Van Aert5. Atom column detection Sandra Van Aert6. Optimal experiment design for nanoparticle atom-counting from ADF STEM imagesSandra Van Aert7. Maximum a posteriori probability Sandra Van Aert8. Discussion and conclusionsSandra Van Aert9. Phase retrieval methods applied to coherent imagingTatiana Latychevskaia
